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dc.contributor.authorChen, CYen_US
dc.contributor.authorCheng, CTen_US
dc.contributor.authorLai, CWen_US
dc.contributor.authorHu, YHen_US
dc.contributor.authorChou, PTen_US
dc.contributor.authorChou, YHen_US
dc.contributor.authorChiu, HTen_US
dc.date.accessioned2014-12-08T15:18:01Z-
dc.date.available2014-12-08T15:18:01Z-
dc.date.issued2005-12-01en_US
dc.identifier.issn1613-6810en_US
dc.identifier.urihttp://dx.doi.org/10.1002/smll.200500227en_US
dc.identifier.urihttp://hdl.handle.net/11536/13028-
dc.description.abstractThe rational design and synthesis of CdSe/CdTe/ZnTe (core-shell-shell) type-II quantum dots are reported. Their photophysical properties are investigated via the interband CdSe -> ZnTe emission and its associated relaxation dynamics. In comparison to the strong CdSe (core only) emission (lambda(max) approximate to 550 nm, Phi(f) approximate to 0.28), a moderate CdSe -> Cd Te emission (lambda(max) approximate to 1026 nm, Phi(f) approximate to 1.2 x 10(-3)) and rather weak CdSe -> Zn Te interband emission (lambda(max) approximate to 1415 nm, Phi(f) approximate to 1.1 x 10(-5)) are resolved for the CdSe/CdTe/ ZnTe structure (3.4/1.8/1.3 nm). Capping CdSe/CdTe with ZnTe results in a distant electron-hole separation between CdSe (electron) and ZnTe (hole) via an intermediate CdTe layer In the case of the CdSe/CdTe/ ZnTe structure, a lifetime as long as 150 ns is observed for the CdSe -> Zn Te (1415 nm) emission. This result further indicates an enormously long radiative lifetime of approximate to 10 ms. Upon excitation of the CdSe/CdTe/ Zn Te structure, the long-lived charge separation may further serve as an excellent hole carrier for catalyzing the redox oxidation reaction.en_US
dc.language.isoen_USen_US
dc.subjectcolloidsen_US
dc.subjectcore-shell materialsen_US
dc.subjectquantum dotsen_US
dc.subjectsemiconductorsen_US
dc.subjecttime-resolved spectroscopyen_US
dc.titleType-II CdSe/CdTe/ZnTe (core-shell-shell) quantum dots with cascade band edges: The separation of electron (at CdSe) and hole (at ZnTe) by the CdTe layeren_US
dc.typeArticleen_US
dc.identifier.doi10.1002/smll.200500227en_US
dc.identifier.journalSMALLen_US
dc.citation.volume1en_US
dc.citation.issue12en_US
dc.citation.spage1215en_US
dc.citation.epage1220en_US
dc.contributor.department應用化學系zh_TW
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.identifier.wosnumberWOS:000233220200015-
dc.citation.woscount40-
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