| Title: | 平面及鰭狀場效電晶體高階奈米缺陷統計物理模式：隨機電報雜訊和偏壓溫度不穩度 Advanced Nanoscale Defect Statistical Model for Random Telegraph Signals and Bias and Temperature Instabilities in Planar Mosfets and FinFETs |
| Authors: | 國立交通大學電子工程學系及電子研究所 |
| Issue Date: | 2016 |
| Gov't Doc #: | MOST104-2221-E009-058-MY3 |
| URI: | http://hdl.handle.net/11536/130564 https://www.grb.gov.tw/search/planDetail?id=11588143&docId=473262 |
| Appears in Collections: | Research Plans |
