Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chen, WC | en_US |
dc.contributor.author | Tseng, SS | en_US |
dc.contributor.author | Wang, CY | en_US |
dc.date.accessioned | 2014-12-08T15:18:08Z | - |
dc.date.available | 2014-12-08T15:18:08Z | - |
dc.date.issued | 2005-11-01 | en_US |
dc.identifier.issn | 0957-4174 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/j.eswa.2005.06.004 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/13107 | - |
dc.description.abstract | In recent years, manufacturing processes have become more and more complex, and meeting high-yield target expectations and quickly identifying root-cause machinesets, the most likely sources of defective products, also become essential issues. In this paper, we first define the root-cause machineset identification problem of analyzing correlations between combinations of machines and the defective products. We then propose the Root-cause Machine Identifier (RMI) method using the technique of association rule mining to solve the problem efficiently and effectively. The experimental results of real datasets show that the actual root-cause machinesets are almost ranked in the top 10 by the proposed RMI method. (c) 2005 Elsevier Ltd. All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | association rule mining | en_US |
dc.subject | defect detection | en_US |
dc.subject | interestingness measurement | en_US |
dc.subject | manufacturing defect detection problem | en_US |
dc.title | A novel manufacturing defect detection method using association rule mining techniques | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1016/j.eswa.2005.06.004 | en_US |
dc.identifier.journal | EXPERT SYSTEMS WITH APPLICATIONS | en_US |
dc.citation.volume | 29 | en_US |
dc.citation.issue | 4 | en_US |
dc.citation.spage | 807 | en_US |
dc.citation.epage | 815 | en_US |
dc.contributor.department | 資訊工程學系 | zh_TW |
dc.contributor.department | Department of Computer Science | en_US |
dc.identifier.wosnumber | WOS:000232757700009 | - |
dc.citation.woscount | 18 | - |
Appears in Collections: | Articles |
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