標題: | A novel manufacturing defect detection method using association rule mining techniques |
作者: | Chen, WC Tseng, SS Wang, CY 資訊工程學系 Department of Computer Science |
關鍵字: | association rule mining;defect detection;interestingness measurement;manufacturing defect detection problem |
公開日期: | 1-十一月-2005 |
摘要: | In recent years, manufacturing processes have become more and more complex, and meeting high-yield target expectations and quickly identifying root-cause machinesets, the most likely sources of defective products, also become essential issues. In this paper, we first define the root-cause machineset identification problem of analyzing correlations between combinations of machines and the defective products. We then propose the Root-cause Machine Identifier (RMI) method using the technique of association rule mining to solve the problem efficiently and effectively. The experimental results of real datasets show that the actual root-cause machinesets are almost ranked in the top 10 by the proposed RMI method. (c) 2005 Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.eswa.2005.06.004 http://hdl.handle.net/11536/13107 |
ISSN: | 0957-4174 |
DOI: | 10.1016/j.eswa.2005.06.004 |
期刊: | EXPERT SYSTEMS WITH APPLICATIONS |
Volume: | 29 |
Issue: | 4 |
起始頁: | 807 |
結束頁: | 815 |
顯示於類別: | 期刊論文 |