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dc.contributor.authorWang, Jinglien_US
dc.contributor.authorYao, Qianen_US
dc.contributor.authorHuang, Chun-Weien_US
dc.contributor.authorZou, Xumingen_US
dc.contributor.authorLiao, Leien_US
dc.contributor.authorChen, Shanshanen_US
dc.contributor.authorFan, Zhiyongen_US
dc.contributor.authorZhang, Kaien_US
dc.contributor.authorWu, Weien_US
dc.contributor.authorXiao, Xianghengen_US
dc.contributor.authorJiang, Changzhongen_US
dc.contributor.authorWu, Wen-Weien_US
dc.date.accessioned2017-04-21T06:56:41Z-
dc.date.available2017-04-21T06:56:41Z-
dc.date.issued2016-10-05en_US
dc.identifier.issn0935-9648en_US
dc.identifier.urihttp://dx.doi.org/10.1002/adma.201602757en_US
dc.identifier.urihttp://hdl.handle.net/11536/132647-
dc.description.abstractHigh-performance MoS2 transistors are developed using atomic hexagonal boron nitride as a tunneling layer to reduce the Schottky barrier and achieve low contact resistance between metal and MoS2. Benefiting from the ultrathin tunneling layer within 0.6 nm, the Schottky barrier is significantly reduced from 158 to 31 meV with small tunneling resistance.en_US
dc.language.isoen_USen_US
dc.subjectcontact resistanceen_US
dc.subjecthexagonal boron nitrideen_US
dc.subjectMoS2en_US
dc.subjecttunnelingen_US
dc.titleHigh Mobility MoS2 Transistor with Low Schottky Barrier Contact by Using Atomic Thick h-BN as a Tunneling Layeren_US
dc.identifier.doi10.1002/adma.201602757en_US
dc.identifier.journalADVANCED MATERIALSen_US
dc.citation.volume28en_US
dc.citation.issue37en_US
dc.citation.spage8302en_US
dc.citation.epage8308en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000386103600028en_US
Appears in Collections:Articles