標題: | High Mobility MoS2 Transistor with Low Schottky Barrier Contact by Using Atomic Thick h-BN as a Tunneling Layer |
作者: | Wang, Jingli Yao, Qian Huang, Chun-Wei Zou, Xuming Liao, Lei Chen, Shanshan Fan, Zhiyong Zhang, Kai Wu, Wei Xiao, Xiangheng Jiang, Changzhong Wu, Wen-Wei 材料科學與工程學系 Department of Materials Science and Engineering |
關鍵字: | contact resistance;hexagonal boron nitride;MoS2;tunneling |
公開日期: | 5-Oct-2016 |
摘要: | High-performance MoS2 transistors are developed using atomic hexagonal boron nitride as a tunneling layer to reduce the Schottky barrier and achieve low contact resistance between metal and MoS2. Benefiting from the ultrathin tunneling layer within 0.6 nm, the Schottky barrier is significantly reduced from 158 to 31 meV with small tunneling resistance. |
URI: | http://dx.doi.org/10.1002/adma.201602757 http://hdl.handle.net/11536/132647 |
ISSN: | 0935-9648 |
DOI: | 10.1002/adma.201602757 |
期刊: | ADVANCED MATERIALS |
Volume: | 28 |
Issue: | 37 |
起始頁: | 8302 |
結束頁: | 8308 |
Appears in Collections: | Articles |