標題: High Mobility MoS2 Transistor with Low Schottky Barrier Contact by Using Atomic Thick h-BN as a Tunneling Layer
作者: Wang, Jingli
Yao, Qian
Huang, Chun-Wei
Zou, Xuming
Liao, Lei
Chen, Shanshan
Fan, Zhiyong
Zhang, Kai
Wu, Wei
Xiao, Xiangheng
Jiang, Changzhong
Wu, Wen-Wei
材料科學與工程學系
Department of Materials Science and Engineering
關鍵字: contact resistance;hexagonal boron nitride;MoS2;tunneling
公開日期: 5-Oct-2016
摘要: High-performance MoS2 transistors are developed using atomic hexagonal boron nitride as a tunneling layer to reduce the Schottky barrier and achieve low contact resistance between metal and MoS2. Benefiting from the ultrathin tunneling layer within 0.6 nm, the Schottky barrier is significantly reduced from 158 to 31 meV with small tunneling resistance.
URI: http://dx.doi.org/10.1002/adma.201602757
http://hdl.handle.net/11536/132647
ISSN: 0935-9648
DOI: 10.1002/adma.201602757
期刊: ADVANCED MATERIALS
Volume: 28
Issue: 37
起始頁: 8302
結束頁: 8308
Appears in Collections:Articles