標題: | Low-Leakage Bidirectional SCR With Symmetrical Trigger Circuit for ESD Protection in 40-nm CMOS Process |
作者: | Altolaguirre, Federico A. Ker, Ming-Dou 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
關鍵字: | Electrostatic Discharge (ESD) Protection;silicon-controlled rectifier (SCR);bidirectional SCR;mixed voltage |
公開日期: | 十二月-2016 |
摘要: | This paper presents a novel bidirectional electrostatic discharge protection device based on a dual silicon-controlled rectifier with a symmetrical trigger circuit. The proposed device has been realized and verified in a 40-nm CMOS process, which can pass a 3.75-kV HBMand a 250-VMM with a very low standby leakage current of similar to 27 nA at 25 degrees C and a bias voltage of 0.9 V with a silicon footprint of only 13 mu m x 100 mu m. |
URI: | http://dx.doi.org/10.1109/TDMR.2016.2600276 http://hdl.handle.net/11536/132756 |
ISSN: | 1530-4388 |
DOI: | 10.1109/TDMR.2016.2600276 |
期刊: | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY |
Volume: | 16 |
Issue: | 4 |
起始頁: | 549 |
結束頁: | 555 |
顯示於類別: | 期刊論文 |