標題: Low-Leakage Bidirectional SCR With Symmetrical Trigger Circuit for ESD Protection in 40-nm CMOS Process
作者: Altolaguirre, Federico A.
Ker, Ming-Dou
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Electrostatic Discharge (ESD) Protection;silicon-controlled rectifier (SCR);bidirectional SCR;mixed voltage
公開日期: 十二月-2016
摘要: This paper presents a novel bidirectional electrostatic discharge protection device based on a dual silicon-controlled rectifier with a symmetrical trigger circuit. The proposed device has been realized and verified in a 40-nm CMOS process, which can pass a 3.75-kV HBMand a 250-VMM with a very low standby leakage current of similar to 27 nA at 25 degrees C and a bias voltage of 0.9 V with a silicon footprint of only 13 mu m x 100 mu m.
URI: http://dx.doi.org/10.1109/TDMR.2016.2600276
http://hdl.handle.net/11536/132756
ISSN: 1530-4388
DOI: 10.1109/TDMR.2016.2600276
期刊: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume: 16
Issue: 4
起始頁: 549
結束頁: 555
顯示於類別:期刊論文