Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Fatah, Faiz Aizad | en_US |
dc.contributor.author | Lin, Yueh-Chin | en_US |
dc.contributor.author | Liu, Ren-Xuan | en_US |
dc.contributor.author | Yang, Kai-Chun | en_US |
dc.contributor.author | Lin, Tai-We | en_US |
dc.contributor.author | Hsu, Heng-Tung | en_US |
dc.contributor.author | Yang, Jung-Hsiang | en_US |
dc.contributor.author | Miyamoto, Yasuyuki | en_US |
dc.contributor.author | Iwai, Hiroshi | en_US |
dc.contributor.author | Hu, Chenming Calvin | en_US |
dc.contributor.author | Salahuddin, Sayeef | en_US |
dc.contributor.author | Chang, Edward Yi | en_US |
dc.date.accessioned | 2017-04-21T06:55:41Z | - |
dc.date.available | 2017-04-21T06:55:41Z | - |
dc.date.issued | 2016-02 | en_US |
dc.identifier.issn | 1882-0778 | en_US |
dc.identifier.uri | http://dx.doi.org/10.7567/APEX.9.026502 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/132819 | - |
dc.description.abstract | A 60-nm-thick E-mode In0.65Ga0.35As/InAs/In0.65Ga0.35As high-electron-mobility transistor (HEMT) was successfully fabricated and evaluated by using Au/Pt/Ti-based non-annealed ohmic technology for high-speed and low-power logic applications. The device exhibited a minimal SS of 69mV/decade, a lower DIBL of 30mV/V, an ION/IOFF ratio above 1.2 x 10(4) at V-DS = 0.5V and a high f(T) of 378GHz and f(max) of 214GHz at V-DS = 1.0V. These results demonstrate that non-annealed ohmic contacts can be used for fabricating E-mode In0.65Ga0.35As/InAs/In0.65Ga0.35As HEMTs with excellent electrical characteristics. The fabricated HEMTs are likely to find use in future high-speed and low-power logic applications. (C) 2016 The Japan Society of Applied Physics. | en_US |
dc.language.iso | en_US | en_US |
dc.title | A 60-nm-thick enhancement mode In0.65Ga0.35As/InAs/In0.65Ga0.35As high-electron-mobility transistor fabricated using Au/Pt/Ti non-annealed ohmic technology for low-power logic applications | en_US |
dc.identifier.doi | 10.7567/APEX.9.026502 | en_US |
dc.identifier.journal | APPLIED PHYSICS EXPRESS | en_US |
dc.citation.volume | 9 | en_US |
dc.citation.issue | 2 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | 光電系統研究所 | zh_TW |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | 國際半導體學院 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.contributor.department | Institute of Photonic System | en_US |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.contributor.department | International College of Semiconductor Technology | en_US |
dc.identifier.wosnumber | WOS:000371297800039 | en_US |
Appears in Collections: | Articles |