標題: | Test of the Practicality and Feasibility of EDoF-Empowered Image Sensors for Long-Range Biometrics |
作者: | Hsieh, Sheng-Hsun Li, Yung-Hui Tien, Chung-Hao 光電工程學系 Department of Photonics |
關鍵字: | wavefront coding;extended depth of field;iris recognition;biometrics |
公開日期: | 1-Dec-2016 |
摘要: | For many practical applications of image sensors, how to extend the depth-of-field (DoF) is an important research topic; if successfully implemented, it could be beneficial in various applications, from photography to biometrics. In this work, we want to examine the feasibility and practicability of a well-known "extended DoF" (EDoF) technique, or "wavefront coding," by building real-time long-range iris recognition and performing large-scale iris recognition. The key to the success of long-range iris recognition includes long DoF and image quality invariance toward various object distance, which is strict and harsh enough to test the practicality and feasibility of EDoF-empowered image sensors. Besides image sensor modification, we also explored the possibility of varying enrollment/testing pairs. With 512 iris images from 32 Asian people as the database, 400-mm focal length and F/6.3 optics over 3 m working distance, our results prove that a sophisticated coding design scheme plus homogeneous enrollment/testing setups can effectively overcome the blurring caused by phase modulation and omit Wiener-based restoration. In our experiments, which are based on 3328 iris images in total, the EDoF factor can achieve a result 3.71 times better than the original system without a loss of recognition accuracy. |
URI: | http://dx.doi.org/10.3390/s16121994 http://hdl.handle.net/11536/133090 |
ISSN: | 1424-8220 |
DOI: | 10.3390/s16121994 |
期刊: | SENSORS |
Volume: | 16 |
Issue: | 12 |
起始頁: | 0 |
結束頁: | 0 |
Appears in Collections: | Articles |
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