完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Wu, Chia Huang | en_US |
dc.contributor.author | Pearn, Wen Lea | en_US |
dc.contributor.author | Tai, Yu Ting | en_US |
dc.contributor.author | Lin, Pi Chuan | en_US |
dc.date.accessioned | 2017-04-21T06:56:20Z | - |
dc.date.available | 2017-04-21T06:56:20Z | - |
dc.date.issued | 2017 | en_US |
dc.identifier.issn | 0361-0918 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1080/03610918.2015.1005234 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/133215 | - |
dc.description.abstract | Process capability index C-p has been the most popular one used in the manufacturing industry to provide numerical measures on process precision. For normally distributed processes with automatic fully inspections, the inspected processes follow truncated normal distributions. In this article, we provide the formulae of moments used for the Edgeworth approximation on the precision measurement C-p for truncated normally distributed processes. Based on the developed moments, lower confidence bounds with various sample sizes and confidence levels are provided and tabulated. Consequently, practitioners can use lower confidence bounds to determine whether their manufacturing processes are capable of preset precision requirements. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Lower confidence bound | en_US |
dc.subject | Moments of truncated normal | en_US |
dc.subject | process capability index C-p | en_US |
dc.title | Lower confidence bounds as precision measure for truncated processes | en_US |
dc.identifier.doi | 10.1080/03610918.2015.1005234 | en_US |
dc.identifier.journal | COMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION | en_US |
dc.citation.volume | 46 | en_US |
dc.citation.issue | 2 | en_US |
dc.citation.spage | 1461 | en_US |
dc.citation.epage | 1480 | en_US |
dc.contributor.department | 工業工程與管理學系 | zh_TW |
dc.contributor.department | Department of Industrial Engineering and Management | en_US |
dc.identifier.wosnumber | WOS:000395194600042 | en_US |
顯示於類別: | 期刊論文 |