完整後設資料紀錄
DC 欄位語言
dc.contributor.authorWu, Chia Huangen_US
dc.contributor.authorPearn, Wen Leaen_US
dc.contributor.authorTai, Yu Tingen_US
dc.contributor.authorLin, Pi Chuanen_US
dc.date.accessioned2017-04-21T06:56:20Z-
dc.date.available2017-04-21T06:56:20Z-
dc.date.issued2017en_US
dc.identifier.issn0361-0918en_US
dc.identifier.urihttp://dx.doi.org/10.1080/03610918.2015.1005234en_US
dc.identifier.urihttp://hdl.handle.net/11536/133215-
dc.description.abstractProcess capability index C-p has been the most popular one used in the manufacturing industry to provide numerical measures on process precision. For normally distributed processes with automatic fully inspections, the inspected processes follow truncated normal distributions. In this article, we provide the formulae of moments used for the Edgeworth approximation on the precision measurement C-p for truncated normally distributed processes. Based on the developed moments, lower confidence bounds with various sample sizes and confidence levels are provided and tabulated. Consequently, practitioners can use lower confidence bounds to determine whether their manufacturing processes are capable of preset precision requirements.en_US
dc.language.isoen_USen_US
dc.subjectLower confidence bounden_US
dc.subjectMoments of truncated normalen_US
dc.subjectprocess capability index C-pen_US
dc.titleLower confidence bounds as precision measure for truncated processesen_US
dc.identifier.doi10.1080/03610918.2015.1005234en_US
dc.identifier.journalCOMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATIONen_US
dc.citation.volume46en_US
dc.citation.issue2en_US
dc.citation.spage1461en_US
dc.citation.epage1480en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000395194600042en_US
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