標題: Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon
作者: Liang, Wen-I
Peng, Chun-Yen
Huang, Rong
Kuo, Wei-Cheng
Huang, Yen-Chin
Adamo, Carolina
Chen, Yi-Chun
Chang, Li
Juang, Jenh-Yih
Schlom, Darrel G.
Chu, Ying-Hao
材料科學與工程學系
電子物理學系
Department of Materials Science and Engineering
Department of Electrophysics
公開日期: 2016
摘要: The successful integration of the strain-driven nanoscale phase boundary of BiFeO3 onto a silicon substrate is demonstrated with extraordinary ferroelectricity and ferromagnetism. The detailed strain history is delineated through a reciprocal space mapping technique. We have found that a distorted monoclinic phase forms prior to a tetragonal-like phase, a phenomenon which may correlates with the thermal strain induced during the growth process.
URI: http://dx.doi.org/10.1039/c5nr07033c
http://hdl.handle.net/11536/133469
ISSN: 2040-3364
DOI: 10.1039/c5nr07033c
期刊: NANOSCALE
Volume: 8
Issue: 3
起始頁: 1322
結束頁: 1326
Appears in Collections:Articles