標題: | Dissociation dynamics of excited neutral fragments of gaseous SiCl4 following Si 2p and Cl 2p core-level excitations |
作者: | Chen, JM Lu, KT Lee, JM Ho, SC Chang, HW 電子物理學系 Department of Electrophysics |
公開日期: | 1-九月-2005 |
摘要: | State-specific dissociation dynamics for excited fragments of gaseous SiCl4 following Cl 2p and Si 2p core-level excitations were characterized by the dispersed UV/optical fluorescence spectroscopy. The core-to-Rydberg excitations at both Si 2p and Cl 2p edges lead to a noteworthy production of excited atomic fragments, neutral and ionic (Si-*,Si+*). In particular, the excited neutral atomic fragments Si-* are significantly reinforced. The core-to-valence excitation at the Si 2p edge generates an enhancement of excited molecular-ion SiCl4+. The experimental results provide deeper insight into the dissociation dynamics for excited neutral fragments of molecules via core-level excitation. |
URI: | http://dx.doi.org/10.1103/PhysRevA.72.032706 http://hdl.handle.net/11536/13366 |
ISSN: | 2469-9926 |
DOI: | 10.1103/PhysRevA.72.032706 |
期刊: | PHYSICAL REVIEW A |
Volume: | 72 |
Issue: | 3 |
起始頁: | 0 |
結束頁: | 0 |
顯示於類別: | 期刊論文 |