標題: | Nanomechanical, structural, and transport properties of Bi3Se2Te thin films |
作者: | Phuoc Huu Le Chiu, Shao-Pin Jian, Sheng-Rui Luo, Chih Wei Lin, Jiunn-Yuan Lin, Juhn-Jong Wu, Kaung Hsiung Gospodinov, M. 電子物理學系 物理研究所 Department of Electrophysics Institute of Physics |
關鍵字: | Topological insulator;Bi3Se2Te;Nanoindentation;Weak antilocalization (WAL);Pulsed laser deposition (PLD) |
公開日期: | 15-九月-2016 |
摘要: | New ternary phase of Bi3Se2Te thin films were successfully grown through pulsed laser deposition with a single Bi2Se2Te crystal as the target. Bi-rich and Se-and Te-deficient compositions deposited at a substrate temperature (T-s) of 250 degrees C and helium gas pressures (P-He) ranging from 2.0 x 10(-5) to 6.5 x 10(-1) Torr aided the formation of the dominant Bi-rich phase: Bi3Se2Te. The films were grown epitaxially on Al2O3 (001) substrates with Bi3Se2Te [001]//Al2O3 [001] and Bi3Se2Te [110]//Al2O3 [210]. An increase in P-He remarkably enhanced the hardness and Young\'s modulus of the films, primarily because of the decrease in nanograin size, following the HallePetch relationship. Moreover, the Bi3Se2Te films present linear magnetoresistance under a high perpendicular magnetic field (B >= 4 T) and twodimensional weak antilocalization effect under a low B (+/- 1 T) which may be attributed to topological insulator surface state (TSS). Clearly, further theoretical calculations and experiments are needed to confirm the suggested interpretation. (C) 2016 Elsevier B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.jallcom.2016.03.226 http://hdl.handle.net/11536/133708 |
ISSN: | 0925-8388 |
DOI: | 10.1016/j.jallcom.2016.03.226 |
期刊: | JOURNAL OF ALLOYS AND COMPOUNDS |
Volume: | 679 |
起始頁: | 350 |
結束頁: | 357 |
顯示於類別: | 期刊論文 |