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dc.contributor.authorWu, CCen_US
dc.contributor.authorLin, CJen_US
dc.date.accessioned2014-12-08T15:01:14Z-
dc.date.available2014-12-08T15:01:14Z-
dc.date.issued1998en_US
dc.identifier.issn0204-3467en_US
dc.identifier.urihttp://hdl.handle.net/11536/133-
dc.description.abstractThe impurity-limited mobility of semiconducting thin wires for nonparabolic structures in n-type Ge has been investigated by scattering from ionized impurities with doping arsenic. The scattering is coming from the background impurities or from the uniform distribution of remote impurities. Results are shown that the impurity-limited mobility due to the scattering from background impurities increases slowly and monotonically with increasing temperature for nondegenerate semiconductors at low temperatures. This is the same qualitative property as that for an ordinary three-dimensional semiconducting structure at low temperatures. However, the mobility due to the scattering from remote impurities increases rapidly with temperature and appears much larger than that from background impurities. It is also shown that the mobility decreases rapidly and monotonically with the wire radius of semiconducting thin wire for the scattering from background impurities or remote impurities. For degenerate semiconductors, the impurity-limited mobility decreases monotonically with the wire radius for the scattering from background impurities, but the mobility does not change with the wire radius quite clearly except a discontinuous point in the neighborhood of wire radius d < 100 Angstrom for the scattering from remote impurities.en_US
dc.language.isoen_USen_US
dc.titleEffect of nonparabolic bands on impurity-limited mobility of semiconducting thin wires in n-type germaniumen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.journalPHYSICS OF LOW-DIMENSIONAL STRUCTURESen_US
dc.citation.volume1-2en_US
dc.citation.spage263en_US
dc.citation.epage269en_US
dc.contributor.department應用數學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Applied Mathematicsen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000072938400035-
Appears in Collections:Conferences Paper