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dc.contributor.authorYang, Hao-, Ien_US
dc.contributor.authorChang, Ming-Hungen_US
dc.contributor.authorLai, Ssu-Yunen_US
dc.contributor.authorWang, Hsiang-Feien_US
dc.contributor.authorHwang, Weien_US
dc.date.accessioned2017-04-21T06:49:42Z-
dc.date.available2017-04-21T06:49:42Z-
dc.date.issued2007en_US
dc.identifier.isbn978-1-4244-0582-4en_US
dc.identifier.urihttp://hdl.handle.net/11536/134455-
dc.description.abstractIn this paper, a new single-ended 6-T SRAM cell is proposed. It has a very strong static noise margin (SNM) during read cycles. Meanwhile, data can be easily written because of floating virtual ground and I-T equalizer insertion within cell. Low-swing writing ability is achieved by these two approaches. A single-ended current-mode sensing amplifier is also presented. This amplifier can sense a very small swing of bitline, equipping with a high noise-rejection and high PVT-tolerance ability. A low-swing 3-port 64x32-bit SRAM macro is simulated in TSMC 130nm CMOS technology. It consumes a minimum of 725 mu W and 658 mu W per-port at IGHz with 1.2V supply voltage for read and write power, respectively.en_US
dc.language.isoen_USen_US
dc.titleA low-power low-swing single-ended multi-port SRAMen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2007 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT), PROCEEDINGS OF TECHNICAL PAPERSen_US
dc.citation.spage28en_US
dc.citation.epage+en_US
dc.contributor.department電機學院zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000247000000007en_US
dc.citation.woscount0en_US
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