Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chen, Yung-Hsiang | en_US |
dc.contributor.author | Hsieh, Yao-Fang | en_US |
dc.contributor.author | Hsu, Chia-Wei | en_US |
dc.contributor.author | Ou-Yang, Mang | en_US |
dc.contributor.author | Lee, Cheng-Chung | en_US |
dc.contributor.author | Hwang, Chi-Hung | en_US |
dc.contributor.author | Liao, Tai-Shan | en_US |
dc.date.accessioned | 2017-04-21T06:48:34Z | - |
dc.date.available | 2017-04-21T06:48:34Z | - |
dc.date.issued | 2012 | en_US |
dc.identifier.isbn | 978-1-4577-1771-0 | en_US |
dc.identifier.issn | 1091-5281 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/134740 | - |
dc.description.abstract | In this study, we have presented the prototype of optical lens eccentric error inspection system based on image processing algorithms. The traditional inspection by using the transmission or reflection measurements is limited to the geometry and size of the lens. In this study, an image based inspection system has developed target on fast, accurate and low-cost to meet the need for lens eccentric error inspection. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | optical lens | en_US |
dc.subject | centering error | en_US |
dc.subject | image processing | en_US |
dc.title | An image based optical lens eccentric error inspection system | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2012 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) | en_US |
dc.citation.spage | 1094 | en_US |
dc.citation.epage | 1097 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000309449100206 | en_US |
dc.citation.woscount | 0 | en_US |
Appears in Collections: | Conferences Paper |