Title: A 28nm 36kb High Speed 6T SRAM with Source Follower PMOS Read and Bit-Line Under-Drive
Authors: Hong, Chi-Hao
Chiu, Yi-Wei
Zhao, Jun-Kai
Jou, Shyh-Jye
Wang, Wen-Tai
Lee, Reed
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Keywords: SRAM;high speed;source follower PMOS Read;bit-line under-drive
Issue Date: 2015
Abstract: In this paper, we present source follower PMOS Read and bit-line under-drive techniques to improve the operation speed as compared to present commercial SRAM compilers. A source follower PMOS is utilized to connect local bit-lines (LBL) to global bit-lines (GBL) instead of using a NAND gate. To further improve the discharging time from LBL to GBL, we propose a bit-line under-drive circuit to reduce the voltage level of LBL. The simulated access time of the proposed macro is 445 ps at slow N slow P (SS) corner, -40 degrees C, 0.81 V. As compared to the SRAM macro which is generated by commercial SRAM compilers with the fastest combination, the access time of the proposed SRAM macro is 12% faster than that of commercial SRAM compilers. A 36kb high speed 6T SRAM macros with source follower PMOS Read and bit-line under-drive techniques is fabricated in 28nm HKMG CMOS process. The measurement results of the chip in SS corner show the proposed SRAM macro passes all MBIST patterns at 500 MHz at 0.81 V, room temperature.
URI: http://hdl.handle.net/11536/134801
ISBN: 978-1-4799-8391-9
ISSN: 0271-4302
Journal: 2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS)
Begin Page: 2549
End Page: 2552
Appears in Collections:Conferences Paper