完整後設資料紀錄
DC 欄位語言
dc.contributor.authorChang, Hua-Yuen_US
dc.contributor.authorJiang, Iris Hui-Ruen_US
dc.contributor.authorChang, Yao-Wenen_US
dc.date.accessioned2017-04-21T06:50:07Z-
dc.date.available2017-04-21T06:50:07Z-
dc.date.issued2011en_US
dc.identifier.isbn978-1-4577-1398-9en_US
dc.identifier.urihttp://hdl.handle.net/11536/134811-
dc.description.abstractDue to the rapidly increasing design complexity in modern IC design, more and more timing failures are detected at late stages. Without deferring time-to-market, metal-only ECO is an economical technique to correct these late-found failures. Typically, a design undergoes many ECO runs in design houses; the usage of spare cells is of significant importance. Hence, in this paper, we aim at timing ECO using the least number of spare cells. We observe that a path with good timing is desired to be geometrically smooth. Different from negative slack and gate delay used in most of prior work, we propose a new metric of timing criticality-fixability-considering the smoothness of critical paths. To measure the smoothness of a path, we use Bezier curve as the golden path. Furthermore, in order to concurrently fix timing violations, we derive the dominance property to divide violated paths into independent segments. Based on Bezier curve smoothing, fixability identification, and the dominance property, we develop an efficient algorithm to fix violations. Compared with the state-of-the-art works, experimental results show that our algorithm not only effectively resolves all timing violations with few spare cells but also achieves 22.8X and 42.6X speedups.en_US
dc.language.isoen_USen_US
dc.titleTiming ECO Optimization via Bezier Curve Smoothing and Fixability Identificationen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2011 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)en_US
dc.citation.spage742en_US
dc.citation.epage746en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000299009100115en_US
dc.citation.woscount2en_US
顯示於類別:會議論文