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dc.contributor.authorTorres, Franciscoen_US
dc.contributor.authorSrivastava, Rohiten_US
dc.contributor.authorRuiz, Javieren_US
dc.contributor.authorWen, H. -P.en_US
dc.contributor.authorBose, Mrinalen_US
dc.contributor.authorBhadra, Jayantaen_US
dc.date.accessioned2017-04-21T06:49:33Z-
dc.date.available2017-04-21T06:49:33Z-
dc.date.issued2009en_US
dc.identifier.isbn978-1-4244-4868-5en_US
dc.identifier.issn1089-3539en_US
dc.identifier.urihttp://hdl.handle.net/11536/134995-
dc.description.abstractReuse of System-on-Chip (SoC) verification stimuli across various design models is a challenging problem. However, if used effectively, it significantly reduces verification time and quickly increases confidence in the robustness of a design. We use pseudo-random stimuli to drive tests on an SoC using simulation BFMs and reuse them on emulation-BFMs. Initial results on a Power Architecture (TM) Technology-based SoC demonstrate about a 100x speedup on the emulator vis-a-vis the simulator.en_US
dc.language.isoen_USen_US
dc.titlePortable simulation/emulation stimulus on an industrial-strength SoCen_US
dc.typeProceedings Paperen_US
dc.identifier.journalITC: 2009 INTERNATIONAL TEST CONFERENCEen_US
dc.citation.spage623en_US
dc.citation.epage623en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000279591000096en_US
dc.citation.woscount0en_US
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