標題: | A robust high-Q micromachined RF inductor for RFIC applications |
作者: | Lin, JW Chen, CC Cheng, YT 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
關鍵字: | accelerative and thermal disturbance system;high-Q micromachined inductor;radio frequency integrated circuit (RFIC);robust design;signal stability |
公開日期: | 1-Jul-2005 |
摘要: | In this paper, a robust micromachined spiral inductor with a cross-shaped sandwich membrane support is proposed and fabricated with fully CMOS compatible post-processes for radio frequency integrated circuit (RFIC) applications. Via the incorporation of a sandwich dielectric membrane (0.7 mu M SiO2/0.7 mu M Si3N4/0.7 mu m TEOS) to enhance the structure rigidity, the inductor can have better signal stability. In comparison, the new design of a similar to 5-nH micromachined inductor can have 45% less inductance variation than the one without the dielectric support while both devices are operated with 10 m/s(2) acceleration. Meanwhile, using a cross shape instead of blanket membrane can also effectively eliminate the inductance variation induced by the working temperature change (20 degrees C to 75 degrees C). The measurement results show the robust inductor can have similar electrical performance to the as-fabricated freely suspended inductor, which has five times Q (quality factor) improvement than the inductor without the substrate removal. It is our belief that the new micromachined inductors can have not only high-Q performance but also better signal stability suitable for wide-range RFIC applications. |
URI: | http://dx.doi.org/10.1109/TED.2005.850612 http://hdl.handle.net/11536/13514 |
ISSN: | 0018-9383 |
DOI: | 10.1109/TED.2005.850612 |
期刊: | IEEE TRANSACTIONS ON ELECTRON DEVICES |
Volume: | 52 |
Issue: | 7 |
起始頁: | 1489 |
結束頁: | 1496 |
Appears in Collections: | Articles |
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