標題: Characterization of a burn-in failure caused by a defective source driver on TFT-LCD panel
作者: Wang, Fred S. C.
Lin, Keh-La
Tso, Ko-Yang
Chao, Chin-Chieh
Wang, Wai William
Yu, Alan
Lee, C. Y.
Kuo, Chien Hung
Wang, C. W. Arex
Chiu, Yi
電控工程研究所
Institute of Electrical and Control Engineering
關鍵字: bit-line defect;CP;COG;TFT-LCD;LCD driver;source driver;DVS;EMMI;EDAX;two-step DAC;ATE
公開日期: 2006
摘要: This paper describes a thorough investigation to identify the root cause of an LCD panel bum-in failure induced by an LCD source driver, which is observed in a large-scale LCD factory producing more than one million LCD panels per month. The investigation demonstrates the effectiveness of the circuit simulation to precisely locate the defective spot which is caused by a metal slice originated from outer rings of an LCD COG (chip-on-glass) source driver. With the aid of emission microscope (EMMI), Energy Dispersive Analysis X-Ray (EDAX), and Chip Probing (CP) tester, the root cause of the failure is well explained. The formation mechanism of metal slice from the outer rings is thoroughly studied. A solution to completely eliminate the source of metal slices from the outer rings during wafer processing is also proposed.
URI: http://hdl.handle.net/11536/135233
ISBN: 1-4244-0205-0
期刊: IPFA 2006: PROCEEDINGS OF THE 13TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS
起始頁: 171
結束頁: +
Appears in Collections:Conferences Paper