Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yang, Yu-Ming | en_US |
dc.contributor.author | Chang, Yu-Wei | en_US |
dc.contributor.author | Jiang, Iris Hui-Ru | en_US |
dc.date.accessioned | 2017-04-21T06:50:13Z | - |
dc.date.available | 2017-04-21T06:50:13Z | - |
dc.date.issued | 2014 | en_US |
dc.identifier.isbn | 978-1-4799-6278-5 | en_US |
dc.identifier.issn | 1933-7760 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/135326 | - |
dc.description.abstract | Static timing analysis is a key process to guarantee timing closure for modern IC designs. Nevertheless, fast growing design complexities and increasing on-chip variations complicate this process. To capture more accurate timing performance of a design, common path pessimism removal is prevalent to eliminate artificially induced pessimism in clock paths during timing analysis. To avoid exhaustive exploration on all paths in a design, in this paper, we present a novel timing analysis framework removing common path pessimism based on block-based static timing analysis, timing graph reduction, and dynamic bounding. Experimental results show that the proposed method is highly scalable, especially with short runtimes for large-scale designs. Moreover, our approach outperforms TAU 2014 timing contest winners, generating accurate results and achieving more than 2.13X speedups. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | static timing analysis | en_US |
dc.subject | common path pessimism removal | en_US |
dc.subject | on-chip variations | en_US |
dc.subject | branch-and-bound | en_US |
dc.title | iTimerC: Common Path Pessimism Removal Using Effective Reduction Methods | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2014 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD) | en_US |
dc.citation.spage | 600 | en_US |
dc.citation.epage | 605 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000393407200093 | en_US |
dc.citation.woscount | 0 | en_US |
Appears in Collections: | Conferences Paper |