Full metadata record
DC FieldValueLanguage
dc.contributor.authorYang, Yu-Mingen_US
dc.contributor.authorChang, Yu-Weien_US
dc.contributor.authorJiang, Iris Hui-Ruen_US
dc.date.accessioned2017-04-21T06:50:13Z-
dc.date.available2017-04-21T06:50:13Z-
dc.date.issued2014en_US
dc.identifier.isbn978-1-4799-6278-5en_US
dc.identifier.issn1933-7760en_US
dc.identifier.urihttp://hdl.handle.net/11536/135326-
dc.description.abstractStatic timing analysis is a key process to guarantee timing closure for modern IC designs. Nevertheless, fast growing design complexities and increasing on-chip variations complicate this process. To capture more accurate timing performance of a design, common path pessimism removal is prevalent to eliminate artificially induced pessimism in clock paths during timing analysis. To avoid exhaustive exploration on all paths in a design, in this paper, we present a novel timing analysis framework removing common path pessimism based on block-based static timing analysis, timing graph reduction, and dynamic bounding. Experimental results show that the proposed method is highly scalable, especially with short runtimes for large-scale designs. Moreover, our approach outperforms TAU 2014 timing contest winners, generating accurate results and achieving more than 2.13X speedups.en_US
dc.language.isoen_USen_US
dc.subjectstatic timing analysisen_US
dc.subjectcommon path pessimism removalen_US
dc.subjecton-chip variationsen_US
dc.subjectbranch-and-bounden_US
dc.titleiTimerC: Common Path Pessimism Removal Using Effective Reduction Methodsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2014 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)en_US
dc.citation.spage600en_US
dc.citation.epage605en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000393407200093en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper