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dc.contributor.authorChiang, KCen_US
dc.contributor.authorHuang, CCen_US
dc.contributor.authorChin, Aen_US
dc.contributor.authorChen, WJen_US
dc.contributor.authorMcAlister, SPen_US
dc.contributor.authorChiu, HFen_US
dc.contributor.authorChen, JRen_US
dc.contributor.authorChi, CCen_US
dc.date.accessioned2014-12-08T15:18:50Z-
dc.date.available2014-12-08T15:18:50Z-
dc.date.issued2005-07-01en_US
dc.identifier.issn0741-3106en_US
dc.identifier.urihttp://dx.doi.org/10.1109/LED.2005.851241en_US
dc.identifier.urihttp://hdl.handle.net/11536/13535-
dc.description.abstractWe have developed novel high-k Ir/TiTaO/TaN capacitors which have high-capacitance density (10.3 fF/mu m(2)), small leakage current at 2 V (1.2 x 10(-8) A/cm(2)), and low voltage linearity of the capacitance (89 ppm/V-2). These excellent results meet the TTRS roadmap requirements for precision -analog capacitors for the year 2018. The good performance is due to the very high K (45) achieved in the TiTaO dielectric and the high work-function (5.2 eV) provided by the Ir electrode.en_US
dc.language.isoen_USen_US
dc.subjectTiTaOen_US
dc.subjectIren_US
dc.subjectMIMen_US
dc.subjectanalogen_US
dc.subjectITRSen_US
dc.titleHigh-kappa Ir/TiTaO/TaN capacitors suitable for analog IC applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/LED.2005.851241en_US
dc.identifier.journalIEEE ELECTRON DEVICE LETTERSen_US
dc.citation.volume26en_US
dc.citation.issue7en_US
dc.citation.spage504en_US
dc.citation.epage506en_US
dc.contributor.department奈米科技中心zh_TW
dc.contributor.departmentCenter for Nanoscience and Technologyen_US
dc.identifier.wosnumberWOS:000230150400026-
dc.citation.woscount32-
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