| 標題: | Very high kappa and high density TiTaO MIM capacitors for analog and RF applications |
| 作者: | Chiang, KC Chin, A Lai, CH Chen, WJ Cheng, CF Hung, BF Liao, CC 電機學院 College of Electrical and Computer Engineering |
| 公開日期: | 2005 |
| 摘要: | For the first time, high density (10.3 fF/mu m(2)), low voltage linearity (alpha = 89 ppm/V-2) and small leakage current (1.2 x 10(-8) A/cm(2) or 5.8 fA/[pF circle V] at 2V) meet all the ITRS requirements of analog capacitor at year 2018. These are achieved by novel high-kappa TiTaO (kappa = 45) and high work-function Ir capacitor, which further improve to very high 23 fF/mu m(2) density and low 81 ppm/V-2 linearity for higher speed analog/RF ICs at 1 GHz, using the fast a decay mechanism with increasing frequency. |
| URI: | http://hdl.handle.net/11536/17833 |
| ISBN: | 4-900784-00-1 |
| 期刊: | 2005 Symposium on VLSI Technology, Digest of Technical Papers |
| 起始頁: | 62 |
| 結束頁: | 63 |
| Appears in Collections: | Conferences Paper |

