Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chiang, KC | en_US |
dc.contributor.author | Chin, A | en_US |
dc.contributor.author | Lai, CH | en_US |
dc.contributor.author | Chen, WJ | en_US |
dc.contributor.author | Cheng, CF | en_US |
dc.contributor.author | Hung, BF | en_US |
dc.contributor.author | Liao, CC | en_US |
dc.date.accessioned | 2014-12-08T15:25:27Z | - |
dc.date.available | 2014-12-08T15:25:27Z | - |
dc.date.issued | 2005 | en_US |
dc.identifier.isbn | 4-900784-00-1 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/17833 | - |
dc.description.abstract | For the first time, high density (10.3 fF/mu m(2)), low voltage linearity (alpha = 89 ppm/V-2) and small leakage current (1.2 x 10(-8) A/cm(2) or 5.8 fA/[pF circle V] at 2V) meet all the ITRS requirements of analog capacitor at year 2018. These are achieved by novel high-kappa TiTaO (kappa = 45) and high work-function Ir capacitor, which further improve to very high 23 fF/mu m(2) density and low 81 ppm/V-2 linearity for higher speed analog/RF ICs at 1 GHz, using the fast a decay mechanism with increasing frequency. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Very high kappa and high density TiTaO MIM capacitors for analog and RF applications | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2005 Symposium on VLSI Technology, Digest of Technical Papers | en_US |
dc.citation.spage | 62 | en_US |
dc.citation.epage | 63 | en_US |
dc.contributor.department | 電機學院 | zh_TW |
dc.contributor.department | College of Electrical and Computer Engineering | en_US |
dc.identifier.wosnumber | WOS:000234973100024 | - |
Appears in Collections: | Conferences Paper |