完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chen, Min-Cheng | en_US |
dc.contributor.author | Chen, Hsiao-Chien | en_US |
dc.contributor.author | Lee, Ta-Hsien | en_US |
dc.contributor.author | Lin, Yu-Hsien | en_US |
dc.contributor.author | Shih, Jyun-Hung | en_US |
dc.contributor.author | Wang, Bo-Wei | en_US |
dc.contributor.author | Hou, Yun-Fang | en_US |
dc.contributor.author | Chen, Yi-Ju | en_US |
dc.contributor.author | Lin, Chia-Yi | en_US |
dc.contributor.author | Lin, Chang-Hsien | en_US |
dc.contributor.author | Hsieh, Yi-Ping | en_US |
dc.contributor.author | Ho, ChiaHua | en_US |
dc.contributor.author | Hua, Mu-Yi | en_US |
dc.contributor.author | Qiu, Jian-Tai | en_US |
dc.contributor.author | Wang, Tahui | en_US |
dc.contributor.author | Yang, Fu-Liang | en_US |
dc.date.accessioned | 2017-04-21T06:49:47Z | - |
dc.date.available | 2017-04-21T06:49:47Z | - |
dc.date.issued | 2013 | en_US |
dc.identifier.isbn | 978-1-4799-0113-5 | en_US |
dc.identifier.isbn | 978-1-4799-0112-8 | en_US |
dc.identifier.issn | 1541-7026 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/135408 | - |
dc.description.abstract | This paper proposes a sensing stability estimation method that involves using an additional forcing electrode to simulate the surface charge coupling effect for bottom gate nanowire sensors. The alteration of the Si nanowire can be observed by using the charging electrode without any complex surface treatment and micro-channel setup. The nanowire sensor has a distinct charge-sensitive slope (V-th shift > 60 mV/10(-16)C) with a wire-width scaling of 35 nm. The proposed estimation technique simplifies the charge sensing operation. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Charge coupling effect | en_US |
dc.subject | dection stability | en_US |
dc.subject | nanosensor fabrication | en_US |
dc.subject | nanowire FET | en_US |
dc.subject | semiconductive sensors | en_US |
dc.title | Estimating the Detection Stability of a Si Nanowire Sensor Using an Additional Charging Electrode | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2013 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000325097500149 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 會議論文 |