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dc.contributor.authorChen, Min-Chengen_US
dc.contributor.authorChen, Hsiao-Chienen_US
dc.contributor.authorLee, Ta-Hsienen_US
dc.contributor.authorLin, Yu-Hsienen_US
dc.contributor.authorShih, Jyun-Hungen_US
dc.contributor.authorWang, Bo-Weien_US
dc.contributor.authorHou, Yun-Fangen_US
dc.contributor.authorChen, Yi-Juen_US
dc.contributor.authorLin, Chia-Yien_US
dc.contributor.authorLin, Chang-Hsienen_US
dc.contributor.authorHsieh, Yi-Pingen_US
dc.contributor.authorHo, ChiaHuaen_US
dc.contributor.authorHua, Mu-Yien_US
dc.contributor.authorQiu, Jian-Taien_US
dc.contributor.authorWang, Tahuien_US
dc.contributor.authorYang, Fu-Liangen_US
dc.date.accessioned2017-04-21T06:49:47Z-
dc.date.available2017-04-21T06:49:47Z-
dc.date.issued2013en_US
dc.identifier.isbn978-1-4799-0113-5en_US
dc.identifier.isbn978-1-4799-0112-8en_US
dc.identifier.issn1541-7026en_US
dc.identifier.urihttp://hdl.handle.net/11536/135408-
dc.description.abstractThis paper proposes a sensing stability estimation method that involves using an additional forcing electrode to simulate the surface charge coupling effect for bottom gate nanowire sensors. The alteration of the Si nanowire can be observed by using the charging electrode without any complex surface treatment and micro-channel setup. The nanowire sensor has a distinct charge-sensitive slope (V-th shift > 60 mV/10(-16)C) with a wire-width scaling of 35 nm. The proposed estimation technique simplifies the charge sensing operation.en_US
dc.language.isoen_USen_US
dc.subjectCharge coupling effecten_US
dc.subjectdection stabilityen_US
dc.subjectnanosensor fabricationen_US
dc.subjectnanowire FETen_US
dc.subjectsemiconductive sensorsen_US
dc.titleEstimating the Detection Stability of a Si Nanowire Sensor Using an Additional Charging Electrodeen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2013 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000325097500149en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper