標題: | Monolithic 3D Chip Integrated with 500ns NVM, 3ps Logic Circuits and SRAM |
作者: | Shen, Chang-Hong Shieh, Jia-Min Wu, Tsung-Ta Huang, Wen-Hsien Yang, Chih-Chao Wan, Chih-Jen Lin, Chein-Din Wang, Hsing-Hsiang Chen, Bo-Yuan Huang, Guo-Wei Lien, Yu-Chung Wong, Simon Wang, Chieh Lai, Yin-Chieh Chen, Chien-Fu Chang, Meng-Fan Hu, Chenming Yang, Fu-Liang 光電工程學系 Department of Photonics |
公開日期: | 2013 |
摘要: | For the first time, a sequentially processed sub-50nm monolithic 3D IC with integrated logic/NVM circuits and SRAM is demonstrated using multiple layers of ultrathin-body (UTB) MOSFET-based circuits interconnected through 300nm-thick interlayer dielectric (ILD). High-performance sub-50nm UTB MOSFETs using deposited ultra-flat and ultra-thin (20nm) epi-like Si enable across-layer and in-layer high-speed 3ps logic circuits and 1-T 500ns plasma-MONOS NVMs as well as 6T SRAMs with static noise margin (SNM) of 280 mV and reduced footprint by 25%. Closely stacked monolithic 3D circuits envision advanced high-performance, rich function, and low power intelligent mobile devices. |
URI: | http://hdl.handle.net/11536/135418 |
ISBN: | 978-1-4799-2306-9 |
期刊: | 2013 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) |
Appears in Collections: | Conferences Paper |