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dc.contributor.authorTu, Po-Minen_US
dc.contributor.authorHuang, Shih-Chengen_US
dc.contributor.authorLin, Ya-wenen_US
dc.contributor.authorYang, Shun-Kueien_US
dc.contributor.authorHsu, Chih-Pengen_US
dc.contributor.authorChang, Jet-Rungen_US
dc.contributor.authorChang, Chun-Yenen_US
dc.date.accessioned2017-04-21T06:50:01Z-
dc.date.available2017-04-21T06:50:01Z-
dc.date.issued2012en_US
dc.identifier.isbn978-1-4673-2396-3en_US
dc.identifier.isbn978-1-4673-2395-6en_US
dc.identifier.urihttp://hdl.handle.net/11536/135444-
dc.description.abstractIn this study, we demonstrate high efficient near-UV LEDs by replacing low-temperature AlGaN by InAlGaN barrier in active region. The efficiency droop in InGaN-based near-UV LED with AlGaN and InAlGaN barrier is investigated. High-resolution x-ray diffraction (HRXRD) and transmission electron microscopy (TEM) measurements show the two barriers are consistent with the lattice, and smooth morphology of quaternary InAlGaN layer can be observed in atomic force microscopy (AFM). Electroluminescence results indicate that the light performance of quaternary LEDs can be enhanced by 25 % and 55 % at 350 mA and 1000mA, respectively. Furthermore, simulations show that quaternary LEDs exhibit 62 % higher radiative recombination rate and low efficiency degradation of 13 % at a high injection current. We attribute this improvement to increasing of carrier concentration and more uniform redistribution of carriers.en_US
dc.language.isoen_USen_US
dc.titleStudy of Efficiency Droop in InGaN-based Near-UV LEDs with Quaternary InAlGaN Barrieren_US
dc.typeProceedings Paperen_US
dc.identifier.journal2012 10TH IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS (ICSE)en_US
dc.citation.spage418en_US
dc.citation.epage421en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000316563400100en_US
dc.citation.woscount1en_US
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