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dc.contributor.authorDee, C. F.en_US
dc.contributor.authorWong, Y. Y.en_US
dc.contributor.authorLim, K. P.en_US
dc.contributor.authorMajlis, B. Y.en_US
dc.date.accessioned2019-04-03T06:47:54Z-
dc.date.available2019-04-03T06:47:54Z-
dc.date.issued2009-01-01en_US
dc.identifier.isbn978-0-8194-7804-7en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://dx.doi.org/10.1117/12.840527en_US
dc.identifier.urihttp://hdl.handle.net/11536/135622-
dc.description.abstractAs a high potential candidate for field-emission emitters, gas sensors, high-critical temperature superconductors, copper oxide NWs have been intensively studied in the synthesized methods, electrical properties and chemical properties. However, there are not many literatures report on the thermal property of them. It is important for one to understand the thermal behavior in order to justify the failure limit of the material especially in nanoscale. In this paper, copper oxide NWs synthesized through direct heating in atmospheric ambient were rapidly annealed in nitrogen ambient at different temperature to check the critical thermal failure point where the free standing copper oxide NWs start to collapse. It was found that copper oxide NWs with diameters around 100 nm started to collapse after 30 minutes of annealing in the nitrogen ambient at 300 degrees C due to the thermal shock incurred by rapid annealing. Increase in temperature will cause the NWs with bigger diameters start to fail. NWs in same diameter range will be able to withstand the temperature up to several hours if no thermal shock is induced. This was happening even when the wires were heated in a higher temperature of 600 degrees C. This result is important for copper oxide NWs when they are incorporated into the other heat sensitive device. The results are important for justifying the failure behavior for devices based on copper oxide NWs.en_US
dc.language.isoen_USen_US
dc.subjectCopper oxide (CuO and Cu2O) nanowiresen_US
dc.subjectThermal propertiesen_US
dc.subjectScanning electron microscope (SEM)en_US
dc.subjectX-ray diffraction (XRD)en_US
dc.subjectAnnealing in nitrogen ambienten_US
dc.titleStudy of the thermal property of copper oxide nanowiresen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.840527en_US
dc.identifier.journalSECOND INTERNATIONAL CONFERENCE ON SMART MATERIALS AND NANOTECHNOLOGY IN ENGINEERINGen_US
dc.citation.volume7493en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000310681100149en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper


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