標題: | Criticality-Dependency-Aware Timing Characterization and Analysis |
作者: | Yang, Yu-Ming Tam, King Ho Jiang, Iris Hui-Ru 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
關鍵字: | Criticality-dependency effect;Timing analysis |
公開日期: | 2015 |
摘要: | For nanometer design, conventional timing analysis may generate over-optimistic results on criticality-dependent paths. A late arrival time at the data input of a flip-flop lengthens the propagation delay from the clock pin to the data output of this flip-flop, thus degrading the timing margins of paths launching from this flip-flop. To remove the optimism, in this paper, we first propose a simple yet effective triangle model to characterize the criticality-dependency effect. Then, we devise a novel criticality-dependency-aware timing analysis flow, which is seamlessly integrated with the common static timing analysis flow. Experimental results show that our approach can effectively analyze the criticality-dependency effect: Based on the proposed triangle model, we can accurately identify all timing-risky Hip Hops and capture the induced timing margin degradation. |
URI: | http://dx.doi.org/10.1145/2744769.2744812 http://hdl.handle.net/11536/135740 |
ISBN: | 978-1-4503-3520-1 |
ISSN: | 0738-100X |
DOI: | 10.1145/2744769.2744812 |
期刊: | 2015 52ND ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC) |
Appears in Collections: | Conferences Paper |