標題: Criticality-Dependency-Aware Timing Characterization and Analysis
作者: Yang, Yu-Ming
Tam, King Ho
Jiang, Iris Hui-Ru
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Criticality-dependency effect;Timing analysis
公開日期: 2015
摘要: For nanometer design, conventional timing analysis may generate over-optimistic results on criticality-dependent paths. A late arrival time at the data input of a flip-flop lengthens the propagation delay from the clock pin to the data output of this flip-flop, thus degrading the timing margins of paths launching from this flip-flop. To remove the optimism, in this paper, we first propose a simple yet effective triangle model to characterize the criticality-dependency effect. Then, we devise a novel criticality-dependency-aware timing analysis flow, which is seamlessly integrated with the common static timing analysis flow. Experimental results show that our approach can effectively analyze the criticality-dependency effect: Based on the proposed triangle model, we can accurately identify all timing-risky Hip Hops and capture the induced timing margin degradation.
URI: http://dx.doi.org/10.1145/2744769.2744812
http://hdl.handle.net/11536/135740
ISBN: 978-1-4503-3520-1
ISSN: 0738-100X
DOI: 10.1145/2744769.2744812
期刊: 2015 52ND ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC)
Appears in Collections:Conferences Paper