標題: | A competitive algorithm to find all defective edges in a graph |
作者: | Hwang, FK 應用數學系 Department of Applied Mathematics |
關鍵字: | group testing;graph testing;competitive algorithm |
公開日期: | 15-Jun-2005 |
摘要: | Consider a graph G (V, E) where a subset D E E is called the set of defective edges. The problem is to identify D with a small number of edge tests, where an edge test takes an arbitrary subset S and asks whether the subgraph G(S) induced by S intersects D (contains a defective edge). Recently, Johann gave an algorithm to find all d defective edges in a graph assuming d D I is known. We give an algorithm with d unknown which requires at most d([log(2) vertical bar E vertical bar] + 4) + 1 tests. The information-theoretic bound, knowing d, is about d log(2) (vertical bar E vertical bar/d). For d fixed, our algorithm is competitive with coefficient 1. (c) 2005 Elsevier B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.dam.2005.02.010 http://hdl.handle.net/11536/13581 |
ISSN: | 0166-218X |
DOI: | 10.1016/j.dam.2005.02.010 |
期刊: | DISCRETE APPLIED MATHEMATICS |
Volume: | 148 |
Issue: | 3 |
起始頁: | 273 |
結束頁: | 277 |
Appears in Collections: | Articles |
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