標題: Interface Polarization Fluctuation Effect of Ferroelectric Hafnium-Zirconium-Oxide Ferroelectric Memory with Nearly Ideal Subthreshold Slope
作者: Chiu, Yu-Chien
Cheng, Chun-Hu
Fan, Chia-Chi
Chen, Po-Chun
Chang, Chun-Yen
Lee, Min-Hung
Liu, Chien
Yen, Shiang-Shiou
Hsu, Hsiao-Hsuan
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2015
URI: http://hdl.handle.net/11536/135989
ISBN: 978-1-4673-8135-2
期刊: 2015 73RD ANNUAL DEVICE RESEARCH CONFERENCE (DRC)
起始頁: 41
結束頁: 42
Appears in Collections:Conferences Paper