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dc.contributor.authorLai, Jung-Chinen_US
dc.contributor.authorHsu, Terng-Yinen_US
dc.date.accessioned2017-04-21T06:48:22Z-
dc.date.available2017-04-21T06:48:22Z-
dc.date.issued2015en_US
dc.identifier.isbn978-1-4799-8748-1en_US
dc.identifier.urihttp://hdl.handle.net/11536/136006-
dc.description.abstractThis paper presents a reliable self-calibration scheme to reduce the mismatches of SR-Latch based 6X time amplifier (TA) to enhance the resolution of time-to-digital converter (TDC). The proposed calibration is embedded to compensate for process, voltage and temperature (PVT) variations that it can eliminate the gain error caused by input mismatches. With the proposed TA, a standard cyclic TDC implemented in UMC 65-nm CMOS process shows that the resolution is 1.25ps.en_US
dc.language.isoen_USen_US
dc.subjectReliableen_US
dc.subjectTAen_US
dc.subjectMismatchen_US
dc.subjectCalibrationen_US
dc.subjectTDCen_US
dc.titleMismatch-Tolerant Time Amplifier with Embedded Self-Calibrationen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2015 IEEE 5TH INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS - BERLIN (ICCE-BERLIN)en_US
dc.citation.spage393en_US
dc.citation.epage396en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000380452700085en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper