標題: Extremely High Mobility Ultra-Thin Metal-Oxide with ns(2)np(2) Configuration
作者: Shih, C. W.
Chin, Albert
Lu, Chun-Fu
Yi, S. H.
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2015
摘要: To increase the transistor\'s current (I-ON) and decrease the off-state leakage (I-OFF), high-mobility, wide-bandgap and ultra-thin body channel materials are crucial for display, sub-10 nm MOSFET, and brain-mimicking 3D IC. The wide-bandgap ultra-thin-film SnO2 nMOSFET has achieved a high I-ON/I-OFF of > 10(7), and high mobility of >0.5X SiO2/Si device value operated at 1 MV/cm. The high mobility TFT is due to the overlapped orbitals.
URI: http://hdl.handle.net/11536/136042
ISBN: 978-1-4673-9894-7
期刊: 2015 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)
顯示於類別:會議論文