Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Liu, Wei-Chang | en_US |
dc.contributor.author | Chan, Ching-Da | en_US |
dc.contributor.author | Huang, Shuo-An | en_US |
dc.contributor.author | Lo, Chi-Wei | en_US |
dc.contributor.author | Yang, Chia-Hsiang | en_US |
dc.contributor.author | Jou, Shyh-Jye | en_US |
dc.date.accessioned | 2017-04-21T06:49:00Z | - |
dc.date.available | 2017-04-21T06:49:00Z | - |
dc.date.issued | 2016 | en_US |
dc.identifier.isbn | 978-1-4799-9988-0 | en_US |
dc.identifier.issn | 1520-6149 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/136368 | - |
dc.description.abstract | This paper presents error-resilient sequential building blocks with time-borrowing capability without extra latches and generated clocks. The circuits are able to recover the timing errors caused by PVT variations and/or over-voltage scaling by up to half a cycle. Unlike prior works, the timing errors can be recovered dynamically through successive time borrowing without stalled cycles, retaining a constant throughput. The circuit structure can be applied to both ASICs and microprocessors. The proposed sequential cells are highly compatible with current cell-based IC design flow, for both feed-forward and feedback datapaths. As a proof of concept, a design with key DSP building blocks has been verified. The results show that the performance of the DSP modules is improved by 13-15% in the worst-case operation condition, yielding a promising solution for stochastic computing under an unreliable operation condition. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Error-resilient circuit | en_US |
dc.subject | sequential cell | en_US |
dc.subject | time borrowing | en_US |
dc.subject | stochastic computing | en_US |
dc.title | ERROR-RESILIENT SEQUENTIAL CELLS WITH SUCCESSIVE TIME BORROWING FOR STOCHASTIC COMPUTING | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2016 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH AND SIGNAL PROCESSING PROCEEDINGS | en_US |
dc.citation.spage | 6545 | en_US |
dc.citation.epage | 6549 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000388373406140 | en_US |
dc.citation.woscount | 0 | en_US |
Appears in Collections: | Conferences Paper |