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dc.contributor.authorHsu, Wei-Shenen_US
dc.contributor.authorHuang, Po-Tsangen_US
dc.contributor.authorWu, Shang-Linen_US
dc.contributor.authorChuang, Ching-Teen_US
dc.contributor.authorHwang, Weien_US
dc.contributor.authorTu, Ming-Hsienen_US
dc.contributor.authorYin, Ming-Yuen_US
dc.date.accessioned2017-04-21T06:49:05Z-
dc.date.available2017-04-21T06:49:05Z-
dc.date.issued2016en_US
dc.identifier.isbn978-1-4673-9498-7en_US
dc.identifier.urihttp://hdl.handle.net/11536/136381-
dc.description.abstractIn this paper, an ultra-low-power near-/sub-threshold first-in-firstout (FIFO) memory is proposed for energy-constrained bio-signal sensing applications. This FIFO memory is designed and implemented using folded bit-interleaved 10T near-/sub-threshold SRAM bit-cells, self-timed pointers and bank-level power control circuits. The 10T SRAM cell is proposed for the bit-interleaving structure with 2.4X write static noise margin (SNM) improvement. The folded bit-interleaving structure reduces the bit-line capacitance and avoids long routing wires for the circular self-timed pointers. Additionally, the event-driven self-timed pointers are designed to reduce the power consumption of clock buffers. For further decreasing the overall power dissipation, bank-level column-based power control circuitry is proposed to switch the voltages for different banks to achieve 60.5% power saving. A 512x16 FIFO memory is implemented in UMC 28nm HKMG CMOS technology. Compared with the prior arts, 47X power reduction and 2.7X area efficiency can be achieved by the proposed design techniques.en_US
dc.language.isoen_USen_US
dc.title28nm Ultra-Low Power Near-/Sub- threshold First-In-First-Out (FIFO) Memory for Multi-Bio-Signal Sensing Platformsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2016 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT)en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000389516800031en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper