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dc.contributor.authorMeng, CCen_US
dc.contributor.authorHsu, SKen_US
dc.contributor.authorWu, THen_US
dc.contributor.authorHuang, GWen_US
dc.date.accessioned2014-12-08T15:19:20Z-
dc.date.available2014-12-08T15:19:20Z-
dc.date.issued2005-04-20en_US
dc.identifier.issn0895-2477en_US
dc.identifier.urihttp://dx.doi.org/10.1002/mop.20759en_US
dc.identifier.urihttp://hdl.handle.net/11536/13806-
dc.description.abstractCMOS deep N-well technology can eliminate the physical effects of NMOS transistors and reduce substrate noise and coupling in order to reach the NMOS channel. These properties result in better LO-IF and LO-RF isolations in a Gilbert micromixer. Two identical 0.18-mu m CMOS downconversion micromixers (except at the RF input stage) with deep N-well or without deep N-well are fabricated in adjacent areas of the same wafer for the purpose of isolation comparison. A -37-dB LO-IF and -38-dB LO-RF isolation downconversion micromixer with 19-dB conversion gain and IP1dB = -20 dBm and IIP3 = -13 dBm when RF = 2.4 GHz and LO = 2.25 GHz is demonstrated here using 0.18-mu m-deep N-well CMOS technology. On the other hand, a downconversion micromixer without deep N-well has almost identical power performance but achieves only -20-dB LO-IF isolation and -21-dB LO-RF isolation. (c) 2005 Wiley Periodicals, Inc.en_US
dc.language.isoen_USen_US
dc.subjectCMOSen_US
dc.subjectCMFBen_US
dc.subjectmixeren_US
dc.subjectdeep N-wellen_US
dc.titleA 0.18-mu m CMOS CMFB downconversion micromixer with deep N-well technology for LO-RF and LO-IF isolation improvementsen_US
dc.typeArticleen_US
dc.identifier.doi10.1002/mop.20759en_US
dc.identifier.journalMICROWAVE AND OPTICAL TECHNOLOGY LETTERSen_US
dc.citation.volume45en_US
dc.citation.issue2en_US
dc.citation.spage168en_US
dc.citation.epage170en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000227909900026-
dc.citation.woscount0-
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