Title: | A high isolation CMFB downconversion micromixer using 0.18-mu m deep N-well CMOS technology |
Authors: | Meng, CC Xu, SK Wu, TH Chao, MH Huang, GW 電信工程研究所 Institute of Communications Engineering |
Issue Date: | 2003 |
Abstract: | CMOS deep N-well technology can eliminate body effects of NMOS transistors and improve LO-IF and LO-RF isolation in a Gilbert micromixer. A 37 dB LO-IF and 38 dB LO-RF isolation downconversion micromixer with 19 dB conversion gain, IP1dB=-19.5 dBm and IIP3=-12.5 dBm when RF=2.4 GHz and LO=2.25 GHz; is demonstrated in this paper by using 0.18 mum deep N-well CMOS technology. The input return loss and output return loss are better than 15 dB for frequencies up to 6 GHz. On the other hand, a downconversion micromixer without deep n-well has almost identical power performance but achieves only 20 dB LO-IF isolation and 21 dB LO-RF isolation even if two kinds of mixers are fabricated in adjacent areas of the same wafer. The downconversion micromixer used here has intrinsically single-to-differential input stage and active differential PMOS loads to increase IF differential gain while CMFB is used to stabilize bias points. An IF differential amplifier converts differential output into a single-ended output. Finally, an off-chip rat-race coupler provides balanced LO signals to facilitate isolation measurement. |
URI: | http://hdl.handle.net/11536/18550 |
ISBN: | 0-7803-7695-1 |
ISSN: | 0149-645X |
Journal: | 2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3 |
Begin Page: | A105 |
End Page: | A108 |
Appears in Collections: | Conferences Paper |