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dc.contributor.authorWu, CCen_US
dc.contributor.authorLin, CJen_US
dc.date.accessioned2014-12-08T15:02:45Z-
dc.date.available2014-12-08T15:02:45Z-
dc.date.issued1996-04-01en_US
dc.identifier.issn0921-4526en_US
dc.identifier.urihttp://hdl.handle.net/11536/1390-
dc.description.abstractThe free-carrier absorption has been studied for quantum well structures fabricated from III-V semiconductors such as it-type InSb films when the acoustic phonon scattering is dominant. The energy band of carriers in semiconductors is assumed to be nonparabolic. The scattering mechanisms of phonons with carriers in semiconductors are considered for the deformation-potential coupling and the piezoelectric coupling separately. Results show that the free-carrier absorption coefficient in n-type InSb films depend upon the polarization of the radiation field relative to the direction normal to the quantum well structures, the photon frequency, the film thickness and the temperature. It is also found that the free-carrier absorption coefficient could be complex due to the interaction of the radiation field and the photon field with carriers in semiconductors. Thus, the index of refraction of semiconducting films could be changed due to this carrier-phonon-photon interaction.en_US
dc.language.isoen_USen_US
dc.titleEffect of phonon scattering on free-carrier absorption in quantum well structuresen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.journalPHYSICA Ben_US
dc.citation.volume220en_US
dc.citation.issueen_US
dc.citation.spage65en_US
dc.citation.epage67en_US
dc.contributor.department應用數學系zh_TW
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentDepartment of Applied Mathematicsen_US
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:A1996UL19600022-
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