標題: A Stochastic-Based Efficient Critical Area Extractor on Open Access Platform
作者: Chen, Bo-Zhou
Chen, Hung-Ming
Huang, Li-Da
Pan, Po-Cheng
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-一月-2009
摘要: Due to inefficient calculation in current critical area analyzer, in this work we present a method of extracting critical area for short faults from the mask layout of an integrated circuit. The method is based on the concept of sampling framework and the geometry computation of critical area. By constructing the density table of layout, our weighted sampling approach can be more efficient, thus more suitable for the larger layout. The algorithm has been implemented on OpenAccess platform to allow efficient extraction of the critical area from an arbitrary mask layout. The results show that this method can reduce computation cost, and can still maintain the accuracy at the same time.
URI: http://hdl.handle.net/11536/13934
ISBN: 978-1-60558-522-2
ISSN: 
期刊: GLSVLSI 2009: PROCEEDINGS OF THE 2009 GREAT LAKES SYMPOSIUM ON VLSI
Volume: 
Issue: 
起始頁: 197
結束頁: 202
顯示於類別:會議論文