Using a periodic square wave test-signal to detect crosstalk faults

標題:	Using a periodic square wave test-signal to detect crosstalk faults
作者:	Wu, MS Lee, CL 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公開日期:	1-三月-2005
摘要:	This BIST scheme simplifies the detection of crosstalk faults in deep-submicron VLSI circuits in the boundary scan environment. Simulation results show that with just a few random patterns fault coverage for. most large benchmark circuits can exceed 90%.
URI:	http://dx.doi.org/10.1109/MDT.2005.49 http://hdl.handle.net/11536/13963
ISSN:	0740-7475
DOI:	10.1109/MDT.2005.49
期刊:	IEEE DESIGN & TEST OF COMPUTERS
Volume:	22
Issue:	2
起始頁:	160
結束頁:	169
顯示於類別：	期刊論文

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