Title: | Using a periodic square wave test-signal to detect crosstalk faults |
Authors: | Wu, MS Lee, CL 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
Issue Date: | 1-Mar-2005 |
Abstract: | This BIST scheme simplifies the detection of crosstalk faults in deep-submicron VLSI circuits in the boundary scan environment. Simulation results show that with just a few random patterns fault coverage for. most large benchmark circuits can exceed 90%. |
URI: | http://dx.doi.org/10.1109/MDT.2005.49 http://hdl.handle.net/11536/13963 |
ISSN: | 0740-7475 |
DOI: | 10.1109/MDT.2005.49 |
Journal: | IEEE DESIGN & TEST OF COMPUTERS |
Volume: | 22 |
Issue: | 2 |
Begin Page: | 160 |
End Page: | 169 |
Appears in Collections: | Articles |
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