Title: Using a periodic square wave test-signal to detect crosstalk faults
Authors: Wu, MS
Lee, CL
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Issue Date: 1-Mar-2005
Abstract: This BIST scheme simplifies the detection of crosstalk faults in deep-submicron VLSI circuits in the boundary scan environment. Simulation results show that with just a few random patterns fault coverage for. most large benchmark circuits can exceed 90%.
URI: http://dx.doi.org/10.1109/MDT.2005.49
http://hdl.handle.net/11536/13963
ISSN: 0740-7475
DOI: 10.1109/MDT.2005.49
Journal: IEEE DESIGN & TEST OF COMPUTERS
Volume: 22
Issue: 2
Begin Page: 160
End Page: 169
Appears in Collections:Articles


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