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dc.contributor.author張維晟zh_TW
dc.contributor.author劉柏村zh_TW
dc.contributor.author謝漢萍zh_TW
dc.contributor.authorChang Wei-Chengen_US
dc.contributor.authorLiu, Po-Tsunen_US
dc.contributor.authorShieh, Han-Pingen_US
dc.date.accessioned2018-01-24T07:38:23Z-
dc.date.available2018-01-24T07:38:23Z-
dc.date.issued2016en_US
dc.identifier.urihttp://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070350565en_US
dc.identifier.urihttp://hdl.handle.net/11536/139794-
dc.language.isoen_USen_US
dc.subject薄膜電晶體zh_TW
dc.subject背通道蝕刻zh_TW
dc.subject氧化銦鎢鋅zh_TW
dc.subjectthin film transisteren_US
dc.subjectback channel etcheden_US
dc.subjectIWZOen_US
dc.title背通道蝕刻型氧化銦鎢鋅薄膜電晶體技術之研究zh_TW
dc.titleStudy on Back-Channel Etched of In-W-Zn-O Thin Film Transistors Technologyen_US
dc.typeThesisen_US
dc.contributor.department光電工程研究所zh_TW
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