標題: | 具雙低電位與全時段抗雜訊 高信賴度閘極驅動陣列之研究 Study on High Reliability Gate Driver on Array With Dual Low Voltage Levels and Full Time Noise Free |
作者: | 黃昱愷 劉柏村 Huang,Yu-Kai Liu,po-tsun 光電工程研究所 |
關鍵字: | 閘極驅動陣列;雙低電位;全時段抗雜訊;多晶矽;負偏壓;閥値電壓回復;GOA;dual low voltages;full-time noise-free;a-Si:H;negative bias;Vth recovering |
公開日期: | 2017 |
URI: | http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070350555 http://hdl.handle.net/11536/140682 |
Appears in Collections: | Thesis |