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標題: 以SIFT及模板匹配為基礎實現DIP式 Y電容外形自動檢測之研究
A SIFT and Template Matching Based Automatic Appearance Detection Method for DIP Y-Type Capacitors
作者: 劉宜容
林昇甫
Liu, Yi-Rong
Lin, Sheng-Fuu
電機學院電機與控制學程
關鍵字: 自動光學檢測;插件式(DIP)電容;瑕疵檢測;Automated Optical Inspection;(DIP) capacitor;Defect Detection
公開日期: 2016
URI: http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070260614
http://hdl.handle.net/11536/140995
Appears in Collections:Thesis


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