標題: 晶圓測試生產排程改善之研究-以I公司為例
Wafer Probing Production Scheduling Improvement - A Case on Company I
作者: 詹志宏
李榮貴
彭文理
Chan,Chih-Hung
Li, Rong-Kwei
Pearn Wen-Lea
管理學院工業工程與管理學程
關鍵字: 生產排程;排程組合;整體設備效率;Production scheduling;Scheduling combination;Overall equipment effectiveness
公開日期: 2016
摘要: 目前晶圓針測廠相關的排程之研究,大多數以數理模式之推導或系統模擬方式進行排程系統設計,但此類研究內容會有許多的假設與限制,然而在實務的生產應用上,這些假設與限制條件經常會面臨實務各項因素的挑戰。 本論文之研究在透過產品生產排程組合,針對實務生產環境,對晶圓針廠測廠的生產排程提供一套簡易直觀的生產排程模式,兼顧生產週期時間與整體設備效率,以供做晶圓針測廠之生產排程作業參考。
Most of researches on scheduling for wafer probing process focus on mathematical or simulation model. But the user they need setup some assumptions and constraints to use those models, but some of those assumptions are not so practical in real world. This essay is to study of the production schedule in combination, for practical production environment, and wafer probing production scheduling to provide a simple and intuitive production scheduling model that include the production cycle time and overall equipment effectiveness rate. For wafer probing production scheduling job to reference.
URI: http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070263324
http://hdl.handle.net/11536/141628
顯示於類別:畢業論文