标题: 晶圆测试生产排程改善之研究-以I公司为例
Wafer Probing Production Scheduling Improvement - A Case on Company I
作者: 詹志宏
李荣贵
彭文理
Chan,Chih-Hung
Li, Rong-Kwei
Pearn Wen-Lea
管理学院工业工程与管理学程
关键字: 生产排程;排程组合;整体设备效率;Production scheduling;Scheduling combination;Overall equipment effectiveness
公开日期: 2016
摘要: 目前晶圆针测厂相关的排程之研究,大多数以数理模式之推导或系统模拟方式进行排程系统设计,但此类研究内容会有许多的假设与限制,然而在实务的生产应用上,这些假设与限制条件经常会面临实务各项因素的挑战。

本论文之研究在透过产品生产排程组合,针对实务生产环境,对晶圆针厂测厂的生产排程提供一套简易直观的生产排程模式,兼顾生产周期时间与整体设备效率,以供做晶圆针测厂之生产排程作业参考。
Most of researches on scheduling for wafer probing process focus on mathematical or simulation model. But the user they need setup some assumptions and constraints to use those models, but some of those assumptions are not so practical in real world.
This essay is to study of the production schedule in combination, for practical production environment, and wafer probing production scheduling to provide a simple and intuitive production scheduling model that include the production cycle time and overall equipment effectiveness rate. For wafer probing production scheduling job to reference.
URI: http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070263324
http://hdl.handle.net/11536/141628
显示于类别:Thesis