14奈米鰭式電晶體自熱效應的新穎溫度量測方法 及其對傳輸機制之影響

標題:	14奈米鰭式電晶體自熱效應的新穎溫度量測方法及其對傳輸機制之影響 A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism
作者:	江孟儒莊紹勳 Jiang, Meng-Ru Chung, Steve S. 電子研究所
關鍵字:	自熱效應;可靠度;傳輸理論;電晶體溫度;self-heating effect;transport;temperature
公開日期:	2017
URI:	http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070450122 http://hdl.handle.net/11536/142285
Appears in Collections:	Thesis