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dc.contributor.authorLee, Shih-Weien_US
dc.contributor.authorChang, Geng-Mingen_US
dc.contributor.authorChang, Ching-Yunen_US
dc.contributor.authorChen, Kuan-Nengen_US
dc.date.accessioned2019-04-03T06:44:29Z-
dc.date.available2019-04-03T06:44:29Z-
dc.date.issued2017-03-01en_US
dc.identifier.issn2168-6734en_US
dc.identifier.urihttp://dx.doi.org/10.1109/JEDS.2017.2649605en_US
dc.identifier.urihttp://hdl.handle.net/11536/145453-
dc.description.abstractA sealing redistribution layer (RDL) approach for the interposer fabrication is developed to simplify the conventional bottom-up process flow. By using this approach, bottom-up plating can achieve the integration of Cu-filler plating and its bottom RDL simultaneously. In this paper, through-glass via in glass interposer or 3-D integration is fabricated using the proposed approach. The electrical measurement and reliability tests indicate that the proposed approach can be an attractive candidate for interposer fabrication with great performance.en_US
dc.language.isoen_USen_US
dc.subjectThrough-Glass via (TGV)en_US
dc.subjectredistribution layeren_US
dc.subjectglass interposeren_US
dc.subject3D integrationen_US
dc.titleA Novel Sealing Redistribution Layer Approach for Through-Glass via Fabricationen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/JEDS.2017.2649605en_US
dc.identifier.journalIEEE JOURNAL OF THE ELECTRON DEVICES SOCIETYen_US
dc.citation.volume5en_US
dc.citation.issue2en_US
dc.citation.spage132en_US
dc.citation.epage135en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000400467500007en_US
dc.citation.woscount3en_US
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